CeMEAI

Minicurso: Topics of Reliabilities

Minicurso: Topics of Reliabilities

N. Balakrishnan, McMaster University, Canadá

 

Day 1- 10:00-12:00 – Title: One-shot Device Testing
Resume: In this topic, I will explain the testing for one-shot devices which produces only either right or left censored data. I will then consider different lifetime distributions and explain the likelihood inference for data obtained from such one-shot device testing.

Day 2- 10:00-12:00 – Title: Left-truncated and right-censored data and associated inference
Resume: In this topic, I will explain a typical industrial application in which the data observed is always left-truncated and right-censored data. I will then develop in detail the EM algorithm approach for the likelihood inference of model parameters for different lifetime distributions, and then use these results to discuss model selection and model discrimination within the family of generalized gamma distributions.

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Compartilhe:

Facebook
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Twitter
Pinterest
LinkedIn